[Mycolleagues] Call For Paper - Extended Abstract Deadline: 2008 International IEEE Symposium on Precision Clock Synchronization for Measurement, Control and Communication

Due to multiple requests the submission deadline for the three-page
extended abstracts is extended until June 2nd, 2008.

Please apologize multiple copies.

Ya-Shian Li-Baboud and Albert Treytl
ISPCS 2008 Program Co-Chairmen

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CALL FOR PAPERS - EXTENDED ABSTRACT DEADLINE
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2008 International IEEE Symposium on
Precision Clock Synchronization
for Measurement, Control and Communication

Plug-Fest September 22-23, 2008
Symposium September 24-26, 2008

University of Michigan
Ann Arbor, Michigan USA

ISPCS 2008
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Conference web site:

http://www.ispcs.org/
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AIM:

The aim of the workshop is to provide a forum for researchers and
practitioners from industry,academia, and government involved in
the area of Precision Clock Synchronization using IEEE 1588 or
similar techniques and protocols.

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WORKSHOP TOPICS:

We welcome paper submissions from engineers and scientists in
industry, academia, and government reporting on all areas of
interest to precision clock synchronization. Topics of interest
included are but not limited to:

- Design, usage and research concerning IEEE 1588

- Implementation design and performance issues

- System and device level studies and system design issues

- Servo design for slave clocks Device design

- Components and embedded implementations

- System integration issues

- Design environments and tools for applications

- Performance test and evaluation tools

- Analytic, modeling, and simulation studies

- System management

- Applications & requirement investigations

- APIs, object models, programming models

- Work-in-Progress reports

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PLUG-FEST:

The plug-fest is an opportunity to test and demonstrate device and
system interoperability and to resolve compatibility issues.
Implementers are invited and encouraged to cooperate with others
to demonstrate system-wide clock synchronization and operation of
protocols across as wide a spectrum of devices as possible.

Prospective participants in the plug-fest should submit a letter
of intent to participate and an abstract of one page or less
describing the devices or applications and indicate the technical
issues.

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EXHIBITIONS AND TUTORIALS:

Sponsoring companies are invited to present their products/prototypes
in the form of an exhibition.

Details on how to become a sponsor as well as exhibition and tutorials
on IEEE 1588 are available at: http://www.ispcs.org.

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SUBMISSION OF PAPERS
Authors should submit a three-page extended abstract (text, figures,
and references, according to the template available at the
conference website) describing the paper's contents.

Extended abstracts will be peer-reviewed. Authors of accepted
abstracts are encouraged to submit a full paper. Final papers
are limited to 6 pages or less in IEEE double column format.
All full papers will be published in the conference proceedings
in CD and on IEEEXplore.

AUTHOR'S SCHEDULE
Three-page extended abstracts for papers EXTENDED JUNE 2, 2008
Letters of intent for plug-fest June 2, 2008
Acceptance notice for papers and plug-fest June 30, 2008
Final written materials to be published August 4, 2008
in proceedings

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ISPCS'2008 CHAIRMEN

GENERAL CO-CHAIRMEN:
Georg Gaderer, Austrian Academy of Sciences, Austria
Kang Lee, NIST, USA

PROGRAM CO-CHAIRMEN:
Albert Treytl, Austrian Academy of Sciences, Austria
Ya-Shian Li-Baboud, NIST, USA

HOST COMMITTEE CO-CHAIRMEN:
James Moyne, University of Michigan, USA
Paolo Ferrari, Univesity of Brescia, Italy
(please send all requests to ispcs@fiss-oeaw.at)

PLUG-FEST CO-CHAIRMEN
Ken Harris
Anatoly Moldovansky

STEERING COMMITTEE
John Eidson
Alessandra Flammini
Thilo Sauter
Hans Weibel

PROGRAM COMMITTEE:
Galina Antonova
Martin Curran-Gray
Paolo Ferrari
Alessandra Flammini
Robert Gao
Bruce Hamilton
Jürgen Jasperneite
Patrick Loschmidt
Nikolaus Kerö
John MacKay
Dirk Mohl
James Moyne
Claudio Narduzzi
Karen O'Donoghue
Silvana Rodrigues
Thilo Sauter
George Shaton
Hans Weibel

National Institute of Standards and Technology

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